61 research outputs found
Evaluating Built-in ECC of FPGA on-chip Memories for the Mitigation of Undervolting Faults
Voltage underscaling below the nominal level is an effective solution for
improving energy efficiency in digital circuits, e.g., Field Programmable Gate
Arrays (FPGAs). However, further undervolting below a safe voltage level and
without accompanying frequency scaling leads to timing related faults,
potentially undermining the energy savings. Through experimental voltage
underscaling studies on commercial FPGAs, we observed that the rate of these
faults exponentially increases for on-chip memories, or Block RAMs (BRAMs). To
mitigate these faults, we evaluated the efficiency of the built-in
Error-Correction Code (ECC) and observed that more than 90% of the faults are
correctable and further 7% are detectable (but not correctable). This
efficiency is the result of the single-bit type of these faults, which are then
effectively covered by the Single-Error Correction and Double-Error Detection
(SECDED) design of the built-in ECC. Finally, motivated by the above
experimental observations, we evaluated an FPGA-based Neural Network (NN)
accelerator under low-voltage operations, while built-in ECC is leveraged to
mitigate undervolting faults and thus, prevent NN significant accuracy loss. In
consequence, we achieve 40% of the BRAM power saving through undervolting below
the minimum safe voltage level, with a negligible NN accuracy loss, thanks to
the substantial fault coverage by the built-in ECC.Comment: 6 pages, 2 figure
On the Resilience of RTL NN Accelerators: Fault Characterization and Mitigation
Machine Learning (ML) is making a strong resurgence in tune with the massive generation of unstructured data which in turn requires massive computational resources. Due to the inherently compute and power-intensive structure of Neural Networks (NNs), hardware accelerators emerge as a promising solution. However, with technology node scaling below 10nm, hardware accelerators become more susceptible to faults, which in turn can impact the NN accuracy. In this paper, we study the resilience aspects of Register-Transfer Level (RTL) model of NN accelerators, in particular, fault characterization and mitigation. By following a High-Level Synthesis (HLS) approach, first, we characterize the vulnerability of various components of RTL NN. We observed that the severity of faults depends on both i) application-level specifications, i.e., NN data (inputs, weights, or intermediate) and NN layers and ii) architectural-level specifications, i.e., data representation model and the parallelism degree of the underlying accelerator. Second, motivated by characterization results, we present a low-overhead fault mitigation technique that can efficiently correct bit flips, by 47.3% better than state-of-the-art methods.We thank Pradip Bose, Alper Buyuktosunoglu, and Augusto Vega from IBM Watson for their contribution to this work. The research leading to these results has received funding from
the European Union’s Horizon 2020 Programme under the LEGaTO Project (www.legato-project.eu), grant agreement nº
780681.Peer ReviewedPostprint (author's final draft
Comprehensive Evaluation of Supply Voltage Underscaling in FPGA on-Chip Memories
In this work, we evaluate aggressive undervolting, i.e., voltage scaling below the nominal level to reduce the energy consumption of Field Programmable Gate Arrays (FPGAs). Usually, voltage guardbands are added by chip vendors to ensure the worst-case process and environmental scenarios. Through experimenting on several FPGA architectures, we measure this voltage guardband to be on average 39% of the nominal level, which in turn, delivers more than an order of magnitude power savings. However, further undervolting below the voltage guardband may cause reliability issues as the result of the circuit delay increase, i.e., start to appear faults. We extensively characterize the behavior of these faults in terms of the rate, location, type, as well as sensitivity to environmental temperature, with a concentration of on-chip memories, or Block RAMs (BRAMs). Finally, we evaluate a typical FPGA-based Neural Network (NN) accelerator under low-voltage BRAM operations. In consequence, the substantial NN energy savings come with the cost of NN accuracy loss. To attain power savings without NN accuracy loss, we propose a novel technique that relies on the deterministic behavior of undervolting faults and can limit the accuracy loss to 0.1% without any timing-slack overhead.Peer ReviewedPostprint (author's final draft
High-Level Debugging and Verification for FPGA-Based Multicore Architectures
Simulators are key tools for computer architecture research. However, multicore architectures represent a highly complex challenge for software simulators, which may suffer from fidelity loss and long execution times. FPGAs can simulate multicore architectures with scalable performance and high accuracy, but the difficulty of debugging could hinder their adoption.
In this paper we propose several techniques for inspection, debugging and verification of multicore architectures, both for software-based and FPGA-based simulations. These debugging extensions are cycle-accurate and unobtrusive. As a proof of concept, we have developed a 24-core RISC multiprocessor that runs the Linux Kernel, for which we provide three simulation modes: a fast, functional simulation; a detailed, cycle-accurate simulation; and a FPGA-based simulation. Our platform can run up to 24 cores and perform full-system verification at 17 million instructions per second.Peer ReviewedPostprint (author's final draft
Fault Characterization Through FPGA Undervolting
The power and energy efficiency of Field Programmable Gate Arrays (FPGAs) are estimated to be up to 20X less than Application Specific Integrated Circuits (ASICs). What is needed to close this gap is aggressive power/energy savings techniques. Such a potentially effective approach is undervolting, which can directly deliver an order of magnitude static and dynamic power savings. However, aggressive undervolting, without accompanying frequency scaling leads to timing related faults, potentially undermining the power savings. Understanding the behavior of these faults and efficiently mitigating them can deliver further power and energy savings in low-voltage designs. In this paper, we conduct a detailed analysis of undervolting FPGA on-chip memories (BRAMs). Through experimental analysis, we find that lowering the supply voltage until a certain conservative level, V min does not introduce any observable fault. For the studied platforms, we measure this voltage guardband gap to be 39% of the nominal level (V nom = 1V, V min = 0.61V). Further undervolting corrupts some of the data bits stored in BRAMs; however, it also reduces the BRAMs power consumption a further 36.1%. When the voltage is lowered below V min , the rate of these faults exponentially increases to 0.06%, by a fully non-uniform distribution over various BRAMs. This paper comprehensively analyzes the behavior of these faults, in terms of rate, type, location, and environmental temperature.The research leading to these results has received funding from the European Union’s Horizon 2020 Programme under the LEGaTO Project (www.legato-project.eu), grant agreement n◦ 780681.Peer ReviewedPostprint (author's final draft
An Experimental Study of Reduced-Voltage Operation in Modern FPGAs for Neural Network Acceleration
We empirically evaluate an undervolting technique, i.e., underscaling the
circuit supply voltage below the nominal level, to improve the power-efficiency
of Convolutional Neural Network (CNN) accelerators mapped to Field Programmable
Gate Arrays (FPGAs). Undervolting below a safe voltage level can lead to timing
faults due to excessive circuit latency increase. We evaluate the
reliability-power trade-off for such accelerators. Specifically, we
experimentally study the reduced-voltage operation of multiple components of
real FPGAs, characterize the corresponding reliability behavior of CNN
accelerators, propose techniques to minimize the drawbacks of reduced-voltage
operation, and combine undervolting with architectural CNN optimization
techniques, i.e., quantization and pruning. We investigate the effect of
environmental temperature on the reliability-power trade-off of such
accelerators. We perform experiments on three identical samples of modern
Xilinx ZCU102 FPGA platforms with five state-of-the-art image classification
CNN benchmarks. This approach allows us to study the effects of our
undervolting technique for both software and hardware variability. We achieve
more than 3X power-efficiency (GOPs/W) gain via undervolting. 2.6X of this gain
is the result of eliminating the voltage guardband region, i.e., the safe
voltage region below the nominal level that is set by FPGA vendor to ensure
correct functionality in worst-case environmental and circuit conditions. 43%
of the power-efficiency gain is due to further undervolting below the
guardband, which comes at the cost of accuracy loss in the CNN accelerator. We
evaluate an effective frequency underscaling technique that prevents this
accuracy loss, and find that it reduces the power-efficiency gain from 43% to
25%.Comment: To appear at the DSN 2020 conferenc
Exceeding Conservative Limits: A Consolidated Analysis on Modern Hardware Margins
Modern large-scale computing systems (data centers, supercomputers, cloud and
edge setups and high-end cyber-physical systems) employ heterogeneous
architectures that consist of multicore CPUs, general-purpose many-core GPUs,
and programmable FPGAs. The effective utilization of these architectures poses
several challenges, among which a primary one is power consumption. Voltage
reduction is one of the most efficient methods to reduce power consumption of a
chip. With the galloping adoption of hardware accelerators (i.e., GPUs and
FPGAs) in large datacenters and other large-scale computing infrastructures, a
comprehensive evaluation of the safe voltage reduction levels for each
different chip can be employed for efficient reduction of the total power. We
present a survey of recent studies in voltage margins reduction at the system
level for modern CPUs, GPUs and FPGAs. The pessimistic voltage guardbands
inserted by the silicon vendors can be exploited in all devices for significant
power savings. On average, voltage reduction can reach 12% in multicore CPUs,
20% in manycore GPUs and 39% in FPGAs.Comment: Accepted for publication in IEEE Transactions on Device and Materials
Reliabilit
On the resilience of deep learning for reduced-voltage FPGAs
Deep Neural Networks (DNNs) are inherently computation-intensive and also power-hungry. Hardware accelerators such as Field Programmable Gate Arrays (FPGAs) are a promising solution that can satisfy these requirements for both embedded and High-Performance Computing (HPC) systems. In FPGAs, as well as CPUs and GPUs, aggressive voltage scaling below the nominal level is an effective technique for power dissipation minimization. Unfortunately, bit-flip faults start to appear as the voltage is scaled down closer to the transistor threshold due to timing issues, thus creating a resilience issue.This paper experimentally evaluates the resilience of the training phase of DNNs in the presence of voltage underscaling related faults of FPGAs, especially in on-chip memories. Toward this goal, we have experimentally evaluated the resilience of LeNet-5 and also a specially designed network for CIFAR-10 dataset with different activation functions of Rectified Linear Unit (Relu) and Hyperbolic Tangent (Tanh). We have found that modern FPGAs are robust enough in extremely low-voltage levels and that low-voltage related faults can be automatically masked within the training iterations, so there is no need for costly software-or hardware-oriented fault mitigation techniques like ECC. Approximately 10% more training iterations are needed to fill the gap in the accuracy. This observation is the result of the relatively low rate of undervolting faults, i.e., <0.1%, measured on real FPGA fabrics. We have also increased the fault rate significantly for the LeNet-5 network by randomly generated fault injection campaigns and observed that the training accuracy starts to degrade. When the fault rate increases, the network with Tanh activation function outperforms the one with Relu in terms of accuracy, e.g., when the fault rate is 30% the accuracy difference is 4.92%.The research leading to these results has received funding from the European Unions Horizon 2020 Programme under the
LEGaTO Project (www.legato-project.eu), grant agreement n 780681.Peer ReviewedPostprint (author's final draft
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